Abstract: The microstructure and texture of tin-oriented silicon steel at different annealing temperatures during high-temperature annealing were studied. The microstructure of the sample was observed by metallographic microscope(OM), and the field emission scanning electron microscope was used to measure the micro-region orientation of the sample and the Channel5 software was used to process and analyze the measurement data. Macroscopic texture analysis was carried out by means of X ray diffractometer (XRD). The results show that, during the high temperature annealing process, the secondary recrystallization of the test steel begins to undergo at 1000-1050℃. Before the abnormal growth of Goss grains, 111< 110> texture, 111< 112> texture, 411 < 148> texture and α texture (111 < 112>) are dominant. There is also a small amount of rotational cubic001< 110> texture.With the increase of temperature, the contents of favorable411< 148> texture increases continuously, and the content of unfavorable 001< 110> texture decreases continuously. After secondary recrystallization of the test steel, the Goss texture is dominant. After secondary recrystallization of silicon steel with tin orientation, the deviation angle of Goss grains decreases. During the abnormal growth of Goss grains, their orientation gradually tends to the standard, which is beneficial to the increase of magnetic induction intensity.