全Cu-Sn IMC焊点制备技术研究现状

    Research Status on Preparation Technology of Full Cu-Sn IMC Solder Joint

    • 摘要: 电子封装中的全IMC焊点由于较传统剩余钎料焊点具有更高的力学和电学性能,因此能够满足更为苛刻的服役条件,具有广阔的应用前景。本文围绕Cu-Sn体系的全IMC焊点制备过程,对焊点的制备方法和相应的连接技术进行了总结。此外,从Cu-Sn焊点制备过程中的组织演变、IMCs的生长机制及焊点的力学性能三个方面对全IMC焊点连接技术进行了对比和分析,从而对全Cu-Sn IMC焊点连接技术的发展方向作出展望。

       

      Abstract: The full IMC solder joint in the electronic packaging has higher mechanical and electrical properties than the traditional residual solder joint, so it can meet more demanding service conditions and has a broad application prospect. The preparation methods of the full IMC solder joint of Cu-Sn system and its welding technologies were summarized. In addition,the technologies for preparing full IMC solder joint were compared and analyzed from three aspects including the microstructure evolution, the growth mechanism of IMCs and the mechanical properties of solder joint, so as to make a prospect for the development direction of the technology of full Cu-Sn IMC solder joint.

       

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