T2紫铜和TA15钛合金异种材料扩散连接的界面组织及连接强度研究

    Study on Interfacial Microstructure and Bonding Strength of Diffusion Bonded Joint of T2 Pure Copper and TA15 Titanium Alloy Dissimilar Materials

    • 摘要: 以1 mm厚的TA15钛合金薄板为中间层,两侧为50 mm厚的紫铜棒,采用真空扩散连接方法开展了T2紫铜和TA15钛合金异种材料的扩散连接试验,利用扫描电镜和电子背散射衍射仪观察分析扩散连接界面的金相组织、元素分布、断口形貌,采用单轴拉伸试验测试了连接界面的连接强度。结果表明:在(840~880) ℃-6 MPa-2 h工艺下所得扩散连接接头的界面微观组织无明显缺陷,扩散层厚度随扩散温度和保温时间的升高而增加。扩散层主要由富钛固溶体、CuTi2相、CuTi相、富铜固溶体组成,晶粒尺寸集中在2~15 μm,晶粒细化且均匀。880 ℃-6 MPa-2 h下制备的铜/钛接头具有最大抗拉强度82 MPa。铜/钛接头拉伸断裂形式属于脆性断裂,断裂位置为CuTi相区域。

       

      Abstract: The intermediate layer is 1 mm thick TA15 titanium alloy sheet, and the both sides are the 50 mm thick T2 pure copper, diffusion bonding experiments of T2 pure copper and TA15 titanium alloy dissimilar materials were conducted using the vacuum diffusion bonding method. The metallographic microstructure, elemental distribution, fracture morphology of the diffusion bonded interface were observed using scanning electron microscopy(SEM) and electron backscatter diffraction (EBSD). The bonding strength of the interface was tested by uniaxial tensile experiments. The results indicate that the interfacial structures of the diffusion bonded joints obtained under the conditions of 840 ℃-880 ℃, 6 MPa, and 2 h have no obvious defects. The thickness of the diffusion layer increases with the increase of the bonding temperature and holding time. The diffusion layer is primarily composed of Ti-rich solid solution, CuTi2 phase, CuTi phase and Cu-rich solid solution. The grain size is concentrated in the range of 2-15 μm, and the grains are refined and uniform. The Cu/Ti joint prepared at 880 ℃, 6 MPa, and 2 h has the maximum tensile strength of 82 MPa. The tensile fracture mode of the Cu/Ti joint is brittle fracture, and the fracture position is at the CuTi phase region.

       

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